The development of <i>Z</i><sub>eff</sub> imaging using a crystal X-ray interferometer

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  • YONEYAMA Akio
    Central Research Laboratory, Hitachi Ltd
  • TAKEYA Satoshi
    Research Institute of Instrumentation Frontier, National Institute of Advanced Industrial Science and Technology
  • HYODO Kazuyuki
    Institute of Materials Science, High Energy Accelerator Research Organization
  • TAKEDA Tohoru
    School of Allied Health Sciences, Kitasato University

Bibliographic Information

Other Title
  • 結晶X線干渉計を用いた<i>Z</i><sub>eff</sub>イメージング法の開発
  • 結晶X線干渉計を用いたZeffイメージング法の開発
  • ケッショウ Xセン カンショウケイ オ モチイタ Zeff イメージングホウ ノ カイハツ

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Abstract

<p>Zeff imaging that provides a way to visualize elemental distributions in samples has been developed. Because the atomic number (Z) of a single-element sample [the effective atomic number (Zeff) for a multiple-element sample] corresponds to the ratio of the real to imaginary part of the complex refractive index, an elemental map is calculable from the ratio of absorption and phase-contrast images. Several metal foils underwent feasibility observations with an imaging system fitted with a two-crystal X-ray interferometer. The obtained Zeff image shows that aluminum, iron, nickel, and copper foils were clearly distinguished and that the nickel and copper Zeff values coincided with the ideal Z number within 5%.</p>

Journal

  • Oyo Buturi

    Oyo Buturi 83 (9), 737-740, 2014-09-10

    The Japan Society of Applied Physics

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