A latch-latch composition of metastability-based true random number generator for Xilinx FPGAs

DOI Web Site 3 Citations 9 References Open Access
  • Fujieda Naoki
    Department of Electrical and Electronic Information Engineering, Toyohashi University of Technology
  • Ichikawa Shuichi
    Department of Electrical and Electronic Information Engineering, Toyohashi University of Technology

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Description

<p>Metastability of RS latches can be a source of entropy for true random number generators (TRNGs). This study presents a new composition of an RS latch using the latch functionality of storage elements of Xilinx FPGAs. Our TRNG is implemented as a soft macro, or RTL description with directives, which is easily integrated into other logic components. According to our evaluation with an Artix-7 FPGA (XC7A35T), our TRNG with 320 latches (716 LUTs and 974 registers) passed the NIST SP 800-22 test suite without post-processing. Also, our new TRNG presented a 2.3x better area-delay product than the existing design to pass the diehard test.</p>

Journal

  • IEICE Electronics Express

    IEICE Electronics Express 15 (10), 20180386-20180386, 2018

    The Institute of Electronics, Information and Communication Engineers

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