Introduction to Ion Beam Analysis (I) (HEIS, MEIS, LEIS) (2)
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- Sasakawa K.
- Kobelco Research Institute, Inc.
Bibliographic Information
- Other Title
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- イオンビーム分析概論(I)(HEIS, MEIS, LEIS)(第2回)
- イオンビーム分析概論(1)HEIS,MEIS,LEIS(第2回)
- イオン ビーム ブンセキ ガイロン 1 HEIS MEIS LEIS ダイ 2カイ
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Description
<p> As an introduction of the ion beam analysis, I will introduce the elementary aspects of ion scattering analysis method of HEIS, MEIS and LEIS. I will explain these four important concepts, kinematic factor, scattering cross section, stopping power, and energy struggling.</p>
Journal
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- Journal of Surface Analysis
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Journal of Surface Analysis 14 (1), 49-58, 2007
The Surface Analysis Society of Japan
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Details 詳細情報について
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- CRID
- 1390564238036294144
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- NII Article ID
- 130007499212
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- NII Book ID
- AA11448771
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- ISSN
- 13478400
- 13411756
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- NDL BIB ID
- 8979238
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed