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- 瓜田 幸幾
- 長崎大学大学院工学研究科物質科学部門
書誌事項
- タイトル別名
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- High-resolution imaging of carbon materials by TEM and STEM
- TEM オヨビ STEM ニ ヨル タンソ ザイリョウ ノ コウブンカイノウ カンサツ ギジュツ
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説明
<p>The transmission electron microscope (TEM) and the scanning transmission electron microscope (STEM) are a powerful tool to understand the local structures and properties of carbon materials. The overall property of a material strongly depends on its local structures. However, the technique has not been used as efficiently as possible compared to XRD and spectroscopy. In this review, the development of spatial resolution and a method for adjusting the electron beam for high-resolution observation are briefly introduced as well as recent studies using the technique.</p>
収録刊行物
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- 炭素
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炭素 2018 (285), 210-216, 2018-11-15
炭素材料学会
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詳細情報 詳細情報について
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- CRID
- 1390564238054588288
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- NII論文ID
- 130007531071
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- NII書誌ID
- AN00140335
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- ISSN
- 18845495
- 03715345
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- NDL書誌ID
- 029375647
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可