Fundamental and Application of Surface analysis (IV)

DOI Web Site

Bibliographic Information

Other Title
  • 表面分析の基礎から応用 (IV)
  • 教育講座 表面分析の基礎から応用(4)
  • キョウイク コウザ ヒョウメン ブンセキ ノ キソ カラ オウヨウ(4)

Search this article

Abstract

<p>We describe “Elemental analysis method” of metallic cross-sectional microstructure by EPMA, Electron Probe Micro-Analyzer. </p><p>We describe the “X-ray spectroscope” as most important parts and a location of “X-ray spectroscope” in the EPMA. Effect of a asperity and irregularity at the surface of analyzed specimen on a quality of an elemental analysis results are described. And we described the effect of location relationship between brazed interface at the analyzed specimen surface and “X-ray spectroscope” on a quality of an elemental analysis results.</p>

Journal

Keywords

Details 詳細情報について

Report a problem

Back to top