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- MIYAZAWA Yasuyuki
- Department of Materials Science, School of Engineering Tokai University
Bibliographic Information
- Other Title
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- 表面分析の基礎から応用 (IV)
- 教育講座 表面分析の基礎から応用(4)
- キョウイク コウザ ヒョウメン ブンセキ ノ キソ カラ オウヨウ(4)
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Description
<p>We describe “Elemental analysis method” of metallic cross-sectional microstructure by EPMA, Electron Probe Micro-Analyzer. </p><p>We describe the “X-ray spectroscope” as most important parts and a location of “X-ray spectroscope” in the EPMA. Effect of a asperity and irregularity at the surface of analyzed specimen on a quality of an elemental analysis results are described. And we described the effect of location relationship between brazed interface at the analyzed specimen surface and “X-ray spectroscope” on a quality of an elemental analysis results.</p>
Journal
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- NIHON GAZO GAKKAISHI (Journal of the Imaging Society of Japan)
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NIHON GAZO GAKKAISHI (Journal of the Imaging Society of Japan) 58 (2), 257-260, 2019-04-10
The Imaging Society of Japan
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Keywords
Details 詳細情報について
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- CRID
- 1390564238083780992
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- NII Article ID
- 130007630000
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- NII Book ID
- AA1137305X
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- ISSN
- 18804675
- 13444425
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- NDL BIB ID
- 029661209
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- CiNii Articles
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- Abstract License Flag
- Disallowed