Integrating Optical Techniques and Electron Microscopy for Nanomaterials Study

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  • Gao Min
    Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University
  • Li Chengyao
    Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University
  • Li Wenliang
    Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University
  • Peng Lian-Mao
    Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University

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Other Title
  • ナノ材料の研究における光学測定と電子顕微鏡法の統合
  • ナノ ザイリョウ ノ ケンキュウ ニ オケル コウガク ソクテイ ト デンシ ケンビキョウホウ ノ トウゴウ

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Abstract

<p>In this paper, we summarize our initial efforts in combining optical techniques and in situ electron microscopy in order to achieve comprehensive characterization of individual one dimensional nanostructures. Two straightforward approaches have been adapted. Firstly, we employ different characterization techniques to locate and measure the same individual nanostructure in a compatible sample for the involved instruments. Secondly, we combine optical fiber probe detector and nanoprobe technique inside a scanning electron microscope to assemble a comprehensive characterization system. Above techniques have been applied to the studies of the origin of the “green” emission and the waveguiding behavior in 1D ZnO nanostructures. The integrated characterization system also enables in situ assembly and characterization of nanostructures for optoelectronic device purposes. Using these examples, we demonstrate that the combination of optical techniques and in situ electron microscopy can be powerful for the studies of optoelectronic nanomaterials and nanodevices.</p>

Journal

  • KENBIKYO

    KENBIKYO 45 (1), 9-12, 2010-03-30

    The Japanese Society of Microscopy

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