Applications of Transmission Electron Microscopy in Material Characterization of Ceramics

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  • セラミックス材料評価における透過型電子顕微鏡法の活用
  • セラミックス ザイリョウ ヒョウカ ニ オケル トウカガタ デンシ ケンビキョウホウ ノ カツヨウ

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Description

<p>TEM/STEM is a powerful tool in evaluation of ceramics materials due to its high spatial and temporal resolution. Performances of devices using ceramics materials are affected by its electric and chemical structure at nanometer scale. In this manuscript, we will describe applications of TEM/STEM for ferroelectric domain analysis, atomic characterization at grain boundary, and in-situ observations of sintering process of BaTiO3 ceramics.</p>

Journal

  • KENBIKYO

    KENBIKYO 44 (1), 7-10, 2009-03-30

    The Japanese Society of Microscopy

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