Measurement of Complex Permittivity of a Dielectric Thin Film by the Cylindrical Cavity Resonator Having Sliding End Plates
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- Kogami Yoshinori
- Utsunomiya University
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- Igarashi Kazufumi
- Utsunomiya University
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- Shimizu Takashi
- Utsunomiya University
Bibliographic Information
- Other Title
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- 可変短絡板付き円筒空洞共振器法による薄形フィルムのミリ波複素誘電率測定
- カヘン タンラク イタツキ エントウ クウドウ キョウシンキホウ ニ ヨル ウスガタ フィルム ノ ミリハフクソ ユウデンリツ ソクテイ
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Abstract
<p>This technical report shows a measurement technique for the complex permittivity of a dielectric thin film with the cylindrical resonator having sliding end plates in the millimeter wave region. In order to eliminate the influence of unwanted TM111 resonance mode which is frequently appeared on the response of TE011 for measurement of the dielectric thin film, the position of the end plates is adjusted adequately. The methodology and experimental results are presented to show the usefulness of this technique.</p>
Journal
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- IEEJ Transactions on Electronics, Information and Systems
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IEEJ Transactions on Electronics, Information and Systems 140 (4), 492-495, 2020-04-01
The Institute of Electrical Engineers of Japan
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Keywords
Details 詳細情報について
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- CRID
- 1390565134843838976
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- NII Article ID
- 130007825209
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- NII Book ID
- AN10065950
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- ISSN
- 13488155
- 03854221
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- NDL BIB ID
- 030376231
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
- KAKEN
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- Abstract License Flag
- Disallowed