書誌事項
- タイトル別名
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- Molecular Dynamics Analysis of the Effect of Crystallographic Orientation on the Strength of a Grain Boundary in a Bicrystal Structure of Copper
抄録
<p>Polycrystalline materials in nano-scale have been found to show the drastic variation of both mechanical and electrical properties strongly depending on the quality of grain boundaries. As for the electroplated copper thin-film interconnections applied to the semiconductor devices, the reliability of the fine interconnections should vary depending on the order of the atom arrangement around grain boundaries. In this research, in order to clarify the effect of the mismatch in the crystallographic orientation between two grains, of which a grain boundary inbetween is consisted, on the strength of the grain boundary, molecular dynamics analysis was applied to the deformation analysis of the bi-crystal structures with various combinations of crystallographic orientations. It was found that the effective strength and fracture mode of bicrystal structures varied drastically depending on the combination of the crystallographic orientations of the two grains in the bicrystal structures.</p>
収録刊行物
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- M&M材料力学カンファレンス
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M&M材料力学カンファレンス 2019 (0), PS16-, 2019
一般社団法人 日本機械学会
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詳細情報 詳細情報について
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- CRID
- 1390566775136251904
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- NII論文ID
- 130007846690
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- ISSN
- 24242845
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可