Interfacial Engineering of Particulate & Surfactant Systems for Enhanced Performance in Industrial Applications

DOI
  • MOUDGIL Brij M.
    Distinguished Professor, NSF I/UCRC Center for Particulate and Surfactant Systems (CPaSS), Department of Materials Science and Engineering, University of Florida, USA
  • FUJI Masayoshi
    Professor, Graduate School of Engineering, Nagoya Institute of Technology, JAPAN

Bibliographic Information

Other Title
  • 産業用高機能化微粒子および界面活性剤の界面工学

Description

<p>Particulate and surfactant systems are an integral part, either in processing or product lines, in essentially every major industry, including Energy and Minerals, Pharmaceutical, Agriculture & Food, Microelectronics, Healthcare, Cosmetics, Consumer Products, and Analytical Instrumentation & Services. In most applications, surface properties and suspension behavior govern the product and process specifications and depend on the synergistic or competitive interactions between the particles and reagent schemes. The primary goal of our research efforts has been to generate the knowledge and technology platforms for industry to develop innovative and greener and more sustainable products and processes. Control of the physicochemical/mechanical properties of surfaces, particles, and self-assembling surfactant systems is attempted to engineer or enhance their performance in industrial applications. Specifically, understanding and control of nano and atomic scale forces between particles, and synthesis of functionalized particles form the foundation for targeted contributions in biomedical, homeland security, defense, advanced materials, sensor, and coating technologies. A synopsis of select projects is presented in this brief review. Additional details can be found in the topic-specific references listed at the end of this manuscript.</p>

Journal

  • THE MICROMERITICS

    THE MICROMERITICS 65 (0), 45-52, 2021-12-15

    Hosokawa Micron Corporation

Details 詳細情報について

  • CRID
    1390571868616573312
  • NII Article ID
    130008129290
  • DOI
    10.24611/micromeritics.2022010
  • ISSN
    24322075
    04299051
  • Text Lang
    ja
  • Data Source
    • JaLC
    • CiNii Articles
  • Abstract License Flag
    Allowed

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