Thickness dependence of surface phonon-polariton propagation length in SiO<sub>2</sub>/Si/SiO<sub>2</sub> structure
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- Tachikawa Saeko
- IIS, Univ. of Tokyo
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- Ordonez-Miranda Jose
- Inst. Pprime, CNRS
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- Wu Yunhui
- IIS, Univ. of Tokyo
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- Jalabert Laurent
- IIS, Univ. of Tokyo LIMMS/CNRS-IIS
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- Anufriev Roman
- IIS, Univ. of Tokyo
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- Volz Sebastian
- IIS, Univ. of Tokyo LIMMS/CNRS-IIS
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- Nomura Masahiro
- IIS, Univ. of Tokyo
Bibliographic Information
- Other Title
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- SiO<sub>2</sub>/Si/SiO<sub>2</sub>構造における表面フォノンポラリトンの伝搬長の膜厚依存性
Journal
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- JSAP Annual Meetings Extended Abstracts
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JSAP Annual Meetings Extended Abstracts 2021.1 (0), 3031-3031, 2021-02-26
The Japan Society of Applied Physics
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Details 詳細情報について
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- CRID
- 1390573947550248576
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- ISSN
- 24367613
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- Text Lang
- ja
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- Data Source
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- JaLC