New instability caused by interface states in wide-bandgap semiconductor devices
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- Hiraiwa Atsushi
- RONLI, Waseda Univ. IMaSS, Nagoya Univ.
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- Horikawa Kiyotaka
- FSE, Waseda Univ.
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- Kawarada Hiroshi
- RONLI, Waseda Univ. FSE, Waseda Univ. KMLMST, Waseda Univ.
Bibliographic Information
- Other Title
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- ワイドバンドギャップ半導体素子における界面準位起因の新しい不安定現象
Journal
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- JSAP Annual Meetings Extended Abstracts
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JSAP Annual Meetings Extended Abstracts 2019.2 (0), 3224-3224, 2019-09-04
The Japan Society of Applied Physics
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Details 詳細情報について
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- CRID
- 1390574290253838464
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- ISSN
- 24367613
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- Text Lang
- ja
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- Data Source
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- JaLC