Optical Characterization of Nitride-semiconductor-based Nano-structures by Scanning Near-field Optical Microscopy
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- Kawakami Yoichi Kawakami
- Kyoto Univ.
Bibliographic Information
- Other Title
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- 近接場光学顕微鏡による窒化物半導体ナノ構造の光学評価
Journal
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- JSAP Annual Meetings Extended Abstracts
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JSAP Annual Meetings Extended Abstracts 2019.2 (0), 64-64, 2019-09-04
The Japan Society of Applied Physics
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Keywords
Details 詳細情報について
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- CRID
- 1390574290261905280
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- ISSN
- 24367613
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- Text Lang
- ja
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- Data Source
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- JaLC