Beam Scanner Integrated Single-mode VCSEL with Cut-off Wavelength Detuning
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- Shimura Keisuke
- Tokyo Tech, First
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- Ho Zeuku
- Tokyo Tech, First
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- Gu Xiaodong
- Tokyo Tech, First
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- Nakahama Masanori
- Tokyo Tech, First
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- Sakaguchi Takahiro
- Tokyo Tech, First
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- Matsutani Akihiro
- Tokyo Tech, Semiconductor and MEMS Processing Division
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- Koyama Fumio
- Tokyo Tech, First
Bibliographic Information
- Other Title
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- カットオフ波長離調構造によるビームスキャナ集積単一モード面発光レーザ
Journal
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- JSAP Annual Meetings Extended Abstracts
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JSAP Annual Meetings Extended Abstracts 2019.1 (0), 1121-1121, 2019-02-25
The Japan Society of Applied Physics
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Keywords
Details 詳細情報について
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- CRID
- 1390574677161137408
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- ISSN
- 24367613
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- Text Lang
- ja
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- Data Source
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- JaLC