Polarization mapping of nitride semiconductors using laser THz emission microscopy
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- Kawayama Iwao
- ILE, Osaka Univ.
Bibliographic Information
- Other Title
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- レーザーTHz放射顕微鏡による窒化物半導体特異構造の分極マッピング
Journal
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- JSAP Annual Meetings Extended Abstracts
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JSAP Annual Meetings Extended Abstracts 2019.1 (0), 210-210, 2019-02-25
The Japan Society of Applied Physics
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Details 詳細情報について
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- CRID
- 1390574677161941504
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- ISSN
- 24367613
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- Text Lang
- ja
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- Data Source
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- JaLC