Investigation of interfacial electronic states in annealed Ag/ZnO junctions
-
- Yamagata Yoshihito
- NIMS Hosei Univ.
-
- Ohsawa Takeo
- NIMS
-
- Hosaka Takumi
- NIMS Hosei Univ.
-
- Montigaud Herve
- Saint-Gobain Recherche
-
- Ishigaki Takamasa
- Hosei Univ.
-
- Ohashi Naoki
- NIMS
Bibliographic Information
- Other Title
-
- Ag/ZnO接合の加熱処理における界面電子状態の評価
Journal
-
- JSAP Annual Meetings Extended Abstracts
-
JSAP Annual Meetings Extended Abstracts 2019.1 (0), 3682-3682, 2019-02-25
The Japan Society of Applied Physics
- Tweet
Keywords
Details 詳細情報について
-
- CRID
- 1390574677163121024
-
- ISSN
- 24367613
-
- Text Lang
- ja
-
- Data Source
-
- JaLC