The Analysis of Polymer Sample TOF-SIMS Data Using Autoencoder
-
- Ito Masaru
- Faculty of Science and Technology, Seikei University
-
- Matsuda Kazuhiro
- Faculty of Science and Technology, Seikei University Surface Science Laboratories, Toray Research Center, Inc
-
- Aoyagi Satoka
- Faculty of Science and Technology, Seikei University
Bibliographic Information
- Other Title
-
- 自己符号化器(autoencoder)を用いた 高分子試料のTOF-SIMSデータ解析
- ジコ フゴウカキ(autoencoder)オ モチイタ コウブンシ シリョウ ノ TOF-SIMS データ カイセキ
Search this article
Description
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) data are generally so complex that multivariate analysis such as principal component analysis (PCA) and multivariate curve resolution (MCR) are often necessary to interpret TOF-SIMS data. Interpreting more complex TOF-SIMS data requires further data analysis methods using machine learning and deep learning. In this study, the application of autoencoder which is one of the unsupervised methods based on artificial neural networks into TOF-SIMS data of three polymers was evaluated.
Journal
-
- Journal of Surface Analysis
-
Journal of Surface Analysis 28 (2), 110-126, 2022-02-10
The Surface Analysis Society of Japan
- Tweet
Details 詳細情報について
-
- CRID
- 1390575108414439424
-
- NII Book ID
- AA11448771
-
- ISSN
- 13478400
- 13411756
-
- NDL BIB ID
- 031996775
-
- Text Lang
- ja
-
- Data Source
-
- JaLC
- NDL Search
- Crossref
- OpenAIRE
-
- Abstract License Flag
- Disallowed