X-ray Analyzed Instruments Using Fine-Structured X-ray Source and Parabolic X-ray Mirror Lens
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- YUN Wenbing
- Sigray Inc.
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- LEWIS Sylvia JY
- Sigray Inc.
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- Lau SH
- Sigray Inc.
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- STRIPE Benjamin
- Sigray Inc.
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- OGAKI Tomomi
- Canon Marketing Japan Inc.
Bibliographic Information
- Other Title
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- 微細構造X線管と放物面X線ミラーレンズを用いたX線分析装置について
- ビサイ コウゾウ Xセンカン ト ホウブツメン Xセン ミラーレンズ オ モチイタ Xセン ブンセキ ソウチ ニ ツイテ
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Description
<p>The high-brightness X-ray source and high-focus X-ray mirror lens are developed for the X-ray analyzed instruments. By manufacturing the targets of the X-ray source a fine structure, it becomes possible to generate X-rays with high brightness and selectable X-ray energy. The high-focus X-ray mirror lens for laboratory equipment that reflect X-rays twice with an axisymmetric paraboloid are developed. The X-ray fluorescence analysis, X-ray absorption spectroscopy, and X-ray CT measurements using these technologies are reported.</p>
Journal
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- Advances in X-Ray Chemical Analysis, Japan
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Advances in X-Ray Chemical Analysis, Japan 51 (0), 31-40, 2020-03-31
The Discussion Group of X-Ray Analysis, The Japan Society for Analytical Chemistry
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Keywords
Details 詳細情報について
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- CRID
- 1390578141488315008
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- NII Article ID
- 40022215482
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- NII Book ID
- AN0000592X
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- ISSN
- 27583651
- 09117806
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- NDL BIB ID
- 030374764
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL Search
- CiNii Articles
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- Abstract License Flag
- Allowed