書誌事項
- タイトル別名
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- Surface, Interface and Thin Layer Analysis using Polarized Neutron Reflectivity Techniques
抄録
<p>We have introduced polarized neutron reflectivity (PNR) techniques, polarization analysis and magnetic contrast variation neutron reflectivity (MCV-NR), for structural analysis of soft material samples. We performed polarization analysis on an Si/SiO2/polypropylene (PP) sample and MCV-NR analysis on a deuterated polystyrene (PS-d)/Fe3O4 sample to investigate their fine structures. Fitting analysis results of the NR data with polarization analysis indicated that the bulk PP plate penetrated into the SiO2 layer due to the sandwiching of the silicon-substrate and PP. On the other hand, the MCV-NR analysis reveals the surface roughness value of the PS-d/Fe3O4 sample to be 2.2 Å. The structural analysis using the NR with the polarization analysis and MCV-NR enables the investigation of fine structures of soft material samples, and the results lead to a better understanding of the nano-layers and surface structures of soft materials.</p>
収録刊行物
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- 波紋
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波紋 32 (3), 120-123, 2022-08-10
日本中性子科学会
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キーワード
詳細情報 詳細情報について
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- CRID
- 1390579830882800896
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- ISSN
- 1884636X
- 1349046X
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- Crossref
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- 抄録ライセンスフラグ
- 使用不可