Ultrahigh-resolution Magnetic Field Imaging by Magnetic-field-free Atomic Resolution Electron Microscopy

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  • SEKI Takehito
    Institute of Engineering Innovation, School of Engineering, The University of Tokyo PRESTO, Japan Science and Technology Agency
  • KOHONO Yuji
    JEOL Ltd.
  • IKUHARA Yuichi
    Institute of Engineering Innovation, School of Engineering, The University of Tokyo Nanostructures Research Laboratory, Japan Fine Ceramics Center
  • SHIBATA Naoya
    Institute of Engineering Innovation, School of Engineering, The University of Tokyo Nanostructures Research Laboratory, Japan Fine Ceramics Center Quantum-Phase Electronics Center, School of Engineering, The University of Tokyo

Bibliographic Information

Other Title
  • 原子分解能磁場フリー電子顕微鏡による超高分解能磁場観察
  • ゲンシ ブンカイノウ ジバ フリー デンシ ケンビキョウ ニ ヨル チョウコウブンカイノウ ジバ カンサツ

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Abstract

<p>With conventional atomic-resolution electron microscopes, atomic-scale observation of magnetic materials has been extremely difficult since the samples are inevitably placed in a strong magnetic field of 2 T or higher. To overcome this limitation, we have developed a new objective lens system that enables atomic-resolution observation while maintaining a sample in the magnetic field-free environment. The electron microscope with this new lens system facilitates atomic structure analysis of magnetic materials and is expected to enable ultra-high resolution magnetic field imaging inside materials and devices. In this review, we describe the development of elemental technologies for the Magnetic field-free Atomic-Resolution Scanning transmission electron microscope (MARS) and show the results of real-space observation of the atomic-scale magnetic field distribution inside antiferromagnetic hematite.</p>

Journal

  • Vacuum and Surface Science

    Vacuum and Surface Science 66 (12), 683-688, 2023-12-10

    The Japan Society of Vacuum and Surface Science

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