Direct observation of nucleation dynamics for atomically thin layered 2D semiconductor material
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- KATO Toshiaki
- Graduate School of Engineering, Tohoku University Advanced Institute for Materials Research (AIMR), Tohoku University
Bibliographic Information
- Other Title
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- 2次元半導体層状物質の結晶成長における核形成過程直接観測
Abstract
<p>Transition metal dichalcogenides (TMDs), atomically thin layered materials, were attracted intense attention due to its outstanding optical and electrical features. In spite of recent progress in production stage, it is still needed to be improved the quality of TMD crystal. Elucidation of detailed growth mechanism should be important to solve this critical issue in TMD crystal growth. Based on this background, we developed in-situ monitoring CVD, which can directly observe the detailed crystal nucleation and growth dynamics of monolayer and single crystal TMD. Here, we show the recent findings about growth mechanism of TMDs revealed by our study such as diffusion length of precursors, non-classical nucleation, and liquid-solid transfer growth together with their theoretical background.</p>
Journal
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- Oyo Buturi
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Oyo Buturi 93 (3), 169-173, 2024-03-01
The Japan Society of Applied Physics
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Details 詳細情報について
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- CRID
- 1390580793844997632
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- ISSN
- 21882290
- 03698009
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- Text Lang
- ja
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- Data Source
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- JaLC
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- Abstract License Flag
- Disallowed