Wavelength Dispersive X-ray Spectrometer for Measuring X-ray Magnetic Circularly Polarized Emission

DOI
  • Inami Toshiya
    Synchrotron Radiation Research Center, National Institutes for Quantum Science and Technology
  • Sugawara Kento
    Synchrotron Radiation Research Center, National Institutes for Quantum Science and Technology
  • Nakama Takao
    Faculty of Science, University of the Ryukyus
  • Suzuki Motohiro
    Kwansei Gakuin University

説明

A feasibility study on a wavelength dispersive x-ray spectrometer for measuring x-ray magnetic circularly polarized emission (XMCPE) is reported. An advantage of this spectrometer is that XMCPE spectra at various emission lines for different elements can be measured relatively easily. Two experiments at the Sm Lα1,2 and Co Kα1,2 emissions were conducted. However, we failed to observe XMCPE spectra. Instead, we found a significant difficulty in adjusting the spectrometer and therefore conclude that this spectrometer is unsuitable for practical measurements.

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詳細情報 詳細情報について

  • CRID
    1390581456540240896
  • DOI
    10.18957/rr.12.2.112
  • ISSN
    21876886
  • 本文言語コード
    en
  • データソース種別
    • JaLC
  • 抄録ライセンスフラグ
    使用不可

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