Scanning probe microscopy
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- MORITA Seizo
- Department of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University
Bibliographic Information
- Other Title
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- 走査プローブ顕微鏡
- 世界物理年記念 走査プローブ顕微鏡--見果てぬ夢のツール
- セカイ ブツリネン キネン ソウサ プローブ ケンビキョウ ミハテヌ ユメ ノ ツール
- −Unlimited dream tool−
- −見果てぬ夢のツール−
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Description
<p>Firstly, we briefly introduce the history of the optical microscope and electron microscope, which involve the use of lenses based on the wave nature of photons and electrons. Then, we introduce in detail the history of scanning tunneling microscopy (STM), atomic force microscopy (AFM) and near-field scanning optical microscopy (SNOM or NSOM), which originate from the concept of lensless microscopes, that is, scanning probe microscopy (SPM), with a small probe scanned along a sample surface. Finally, we introduce the state-of-the-art and future prospects of STM, AFM and SPM.</p>
Journal
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- Oyo Buturi
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Oyo Buturi 77 (9), 1049-1058, 2008-09-10
The Japan Society of Applied Physics
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Keywords
Details 詳細情報について
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- CRID
- 1390845702287377920
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- NII Article ID
- 10024192126
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- NII Book ID
- AN00026679
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- ISSN
- 21882290
- 03698009
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- NDL BIB ID
- 9640152
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- CiNii Articles
- KAKEN
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- Abstract License Flag
- Disallowed