Scanning probe microscopy

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  • MORITA Seizo
    Department of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University

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Other Title
  • 走査プローブ顕微鏡
  • 世界物理年記念 走査プローブ顕微鏡--見果てぬ夢のツール
  • セカイ ブツリネン キネン ソウサ プローブ ケンビキョウ ミハテヌ ユメ ノ ツール
  • −Unlimited dream tool−
  • −見果てぬ夢のツール−

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Abstract

<p>Firstly, we briefly introduce the history of the optical microscope and electron microscope, which involve the use of lenses based on the wave nature of photons and electrons. Then, we introduce in detail the history of scanning tunneling microscopy (STM), atomic force microscopy (AFM) and near-field scanning optical microscopy (SNOM or NSOM), which originate from the concept of lensless microscopes, that is, scanning probe microscopy (SPM), with a small probe scanned along a sample surface. Finally, we introduce the state-of-the-art and future prospects of STM, AFM and SPM.</p>

Journal

  • Oyo Buturi

    Oyo Buturi 77 (9), 1049-1058, 2008-09-10

    The Japan Society of Applied Physics

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