Observation of electronic structure under electric-field by soft x-ray photoemission microscopy

DOI

Bibliographic Information

Other Title
  • 軟X線顕微光電子分光によるCa<sub>2</sub>RuO<sub>4</sub>の電場印加下電子状態観測

Journal

Details 詳細情報について

  • CRID
    1390845702306043392
  • NII Article ID
    130007735282
  • DOI
    10.11316/jpsgaiyo.73.2.0_1535
  • ISSN
    21890803
  • Text Lang
    ja
  • Data Source
    • JaLC
    • CiNii Articles

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