-
- Goto K.
- AIST-Chubu Center
Bibliographic Information
- Other Title
-
- SIにつながる真の電子スペクトルを求める実験法(VI)
- SIにつながる真の電子スペクトルを求める実験法(6)
- SI ニ ツナガル シン ノ デンシ スペクトル オ モトメル ジッケンホウ 6
Search this article
Description
<p> The high voltage generation, measurements, and calibration were described. Measurements of 10 ppm in uncertainty for an AES was attained. This was achieved by compensating a temperature coefficient and accounting a power coefficient of the resistors. A standard high-voltage of about 100 V which can be used in a high-voltage work was obtained with Zener diodes. An idea for the PC programmable instruments of the old instruments was proposed.</p>
Journal
-
- Journal of Surface Analysis
-
Journal of Surface Analysis 14 (1), 59-68, 2007
The Surface Analysis Society of Japan
- Tweet
Details 詳細情報について
-
- CRID
- 1390845713013235072
-
- NII Article ID
- 130007499200
-
- NII Book ID
- AA11448771
-
- ISSN
- 13478400
- 13411756
-
- NDL BIB ID
- 8979251
-
- Text Lang
- ja
-
- Data Source
-
- JaLC
- NDL
- Crossref
- CiNii Articles
-
- Abstract License Flag
- Disallowed