Impurity hydrogen site and electronic state in wide-gap semiconductor ZnO as investigated by muon spectroscopy

DOI

Bibliographic Information

Other Title
  • ワイドギャップ半導体ZnOにおけるミュオン測定で明らかにする不純物水素サイトと電子状態

Journal

Details 詳細情報について

  • CRID
    1390845713018482432
  • NII Article ID
    130007507847
  • DOI
    10.11316/jpsgaiyo.72.2.0_2342
  • ISSN
    21890803
  • Text Lang
    ja
  • Data Source
    • JaLC
    • CiNii Articles

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