Fundamental and Application of Surface Analysis (II)

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  • 表面分析の基礎から応用 (II)
  • 教育講座 表面分析の基礎から応用(2)
  • キョウイク コウザ ヒョウメン ブンセキ ノ キソ カラ オウヨウ(2)

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<p>We summarized important points when metallic cross-sectional microstructure were observed by optical microscope and scanning electron microscope. Quality of a metallic cross-sectional microstructure depended on a specimen production process for observation. It was needed that a specimen for observation by an optical microscope and a scanning electron microscope was produced according to final observation results.</p><p>And type of the optical microscope and operating procedures influenced observation results strongly. In that case of the scanning electron microscope, location relationship between a metallic cross-sectional microstructure and electron scanning line position was very important. And we must make full use of a secondary electron image and a back scattered electron image in that case of scanning electron microscope.</p>

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