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- 清水 智子
- 慶應義塾大学理工学部
書誌事項
- タイトル別名
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- Characterization of carbon materials using high-resolution scanning probe microscopy
- コウカイゾウド ソウサガタ プローブ ケンビキョウ ニ ヨル タンソ ザイリョウ ノ ヒョウカ
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<p>Scanning probe microscopy (SPM) is an experimental technique that enables the investigation of surface structures and the properties of various materials with high spatial resolution. Using specially designed and prepared probe tips, it is possible to obtain images that show molecular frameworks similar to their ball-stick models. High resolution SPM is also useful to study carbon-based materials. In this article, starting from the basics of SPM, recent studies on the identification of dopants in graphene nanoribbons, the comparison of three different atomic force microscopy (AFM) techniques to observe fullerene molecules, and the correlation between AFM images and locations of metallofullerenes in peapod carbon nanotubes are explained.</p>
収録刊行物
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- 炭素
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炭素 2018 (285), 204-209, 2018-11-15
炭素材料学会
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詳細情報 詳細情報について
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- CRID
- 1390845713031298432
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- NII論文ID
- 130007531066
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- NII書誌ID
- AN00140335
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- ISSN
- 18845495
- 03715345
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- NDL書誌ID
- 029375621
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可