A Development of a High Resolution FM-AFM Working in Air or Solution

DOI

Bibliographic Information

Other Title
  • 大気中・液中で動作する高分解能FM-AFMの開発

Description

<p>Frequency modulation atomic force microscopy (FM-AFM) is a powerful method not only for imaging surfaces at the atomic scale but also for investigating surface properties. However, the high-resolution FM-AFM observations have been limited in vacuum environments where the Q-factor of the cantilever resonance usually exceeds 10,000. It is heavily reduced in air or liquids and hence the effective force sensitivity is decreased. We have developed a low noise cantilever deflection sensor by optimizing the optical design of the sensor and by modulating the laser power with a high frequency signal. Using this sensor, we have developed a high-resolution FM-AFM working in both air and liquids.</p>

Journal

  • KENBIKYO

    KENBIKYO 47 (1), 22-25, 2012-03-30

    The Japanese Society of Microscopy

Keywords

Details 詳細情報について

  • CRID
    1390846609783272448
  • NII Article ID
    130007768862
  • DOI
    10.11410/kenbikyo.47.1_22
  • ISSN
    24342386
    13490958
  • Text Lang
    ja
  • Data Source
    • JaLC
    • CiNii Articles
  • Abstract License Flag
    Disallowed

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