Observation of Microstructures by Diffraction Contrast Technique
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- Arakawa Kazuto
- 大阪大学超高圧電子顕微鏡センター
Bibliographic Information
- Other Title
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- 回折コントラスト法による微細構造の観察
- カイセツ コントラストホウ ニ ヨル ビサイ コウゾウ ノ カンサツ
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Description
<p>TEM diffraction contrast technique is considerably useful for observation of microstructures in comparatively thick specimens to which high-resolution TEM/STEM is not applicable and grasp of the features of specimens over wide area. In this article, mechanism of the diffraction-contrast imaging of lattice defects and its applications are concisely presented.</p>
Journal
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- KENBIKYO
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KENBIKYO 46 (4), 258-265, 2011-12-30
The Japanese Society of Microscopy
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Keywords
Details 詳細情報について
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- CRID
- 1390846609786127872
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- NII Article ID
- 10030268191
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- NII Book ID
- AA11917781
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- ISSN
- 24342386
- 13490958
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- NDL BIB ID
- 023470162
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- CiNii Articles
- KAKEN
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- Abstract License Flag
- Disallowed