Observation of Microstructures by Diffraction Contrast Technique

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  • 回折コントラスト法による微細構造の観察
  • カイセツ コントラストホウ ニ ヨル ビサイ コウゾウ ノ カンサツ

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Abstract

<p>TEM diffraction contrast technique is considerably useful for observation of microstructures in comparatively thick specimens to which high-resolution TEM/STEM is not applicable and grasp of the features of specimens over wide area. In this article, mechanism of the diffraction-contrast imaging of lattice defects and its applications are concisely presented.</p>

Journal

  • KENBIKYO

    KENBIKYO 46 (4), 258-265, 2011-12-30

    The Japanese Society of Microscopy

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