酸窒化亜鉛を用いた薄膜トランジスタの特性改善

書誌事項

タイトル別名
  • Improvement in Performance of Zinc Oxynitride Thin-Film Transistors

この論文をさがす

説明

Si-doped zinc oxynitride (ZnON) thin-film transistors (TFTs) were fabricated using co-sputtering of Zn and Si targets. It was found that Si doping was effective at decreasing the carrier concentration in ZnON films. Furthermore, it was demonstrated that Si-doped ZnON-TFTs exhibited less negative threshold voltages than those of non-doped ZnON-TFTs.

収録刊行物

詳細情報 詳細情報について

  • CRID
    1390846609799063296
  • NII論文ID
    130007789606
  • DOI
    10.11485/iteac.2017.0_31c-1
  • ISSN
    24242292
    13431846
  • 本文言語コード
    ja
  • データソース種別
    • JaLC
    • CiNii Articles
  • 抄録ライセンスフラグ
    使用不可

問題の指摘

ページトップへ