[Updated on Apr. 18] Integration of CiNii Articles into CiNii Research

A Study on Statistical Forecasting Methods of Foreign Patent Cost

DOI
  • TAKAHASHI Shogo
    Regional Co-creation Center for Industry and Society, Kagoshima University
  • MANABE Seiji
    Graduate School of International Social Sciences, Yokohama National University
  • MOTOHASHI Eiji
    Graduate School of International Social Sciences, Yokohama National University
  • KISHIMOTO Shigeo
    Corporate Intellectual Property Division, Mitsubishi Electric Corp.
  • HAGIHARA Toru
    Corporate Intellectual Property Division, Mitsubishi Electric Corp.
  • KIM Eunhun
    Corporate Intellectual Property Division, Mitsubishi Electric Corp.

Bibliographic Information

Other Title
  • 海外特許費用の統計的予測手法に関する研究

Abstract

<p>Filing a foreign patent is extremely expensive. The indirect costs have a major impact on corporate earnings. Therefore, firms must manage the cost of filing for a foreign patent by forecasting such costs in the forthcoming fiscal years and including them into their management strategy. However, costs vary with the timing and number of inventions, thus complicating cost forecasting. Thus, firms need to use simple methods to predict foreign patent costs for the fiscal year in question by referencing the previous year's actual numbers. The present study compares multiple statistical forecasting methods to find a more accurate method of estimating foreign patent costs, particularly for the United States, and to apply this method to corporate practice. The study found a precise method of forecasting future overseas patent costs by selecting the most appropriate methodology for the existing circumstances from among multiple forecasting methodologies by using a certain algorithm and developing a forecasting system.</p>

Journal

Details

  • CRID
    1390846609810453760
  • NII Article ID
    130007806319
  • DOI
    10.11305/jjsip.16.1_1_35
  • ISSN
    18818706
    13496913
  • Text Lang
    ja
  • Data Source
    • JaLC
    • CiNii Articles
  • Abstract License Flag
    Disallowed

Report a problem

Back to top