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On-machine measurement system of ultra-precision machine tool using confocal chromatic probe
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- Duan Hao
- Tokyo Denki University RIKEN Center for Advanced Photonics
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- Morita Shinya
- Tokyo Denki University
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- Hosobata Takuya
- RIKEN Center for Advanced Photonics
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- Takeda Masahiro
- RIKEN Center for Advanced Photonics
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- Yamagata Yutaka
- RIKEN Center for Advanced Photonics
Bibliographic Information
- Other Title
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- 共焦点色収差式レーザ変位計を用いた超精密加工機の機上計測システム
Description
This paper reports a result of construction of an on-machine measurement system on the ultraprecision machine tool, using a confocal chromatic probe to measurement material surface and using a real-time position capturing method in which branched encoder signals are recorded in external data storage, to evaluate motion trajectories on the ultra-precision machine tool. In the on-machine measurement on the optical flat, the micro waviness has been observed, which is considered to be a cause of mid spatial frequency profile error. The repeatability of measurement is about 2 nm in the X-axis direction and 7.5 nm in the Z-axis direction.
Journal
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- The Proceedings of The Manufacturing & Machine Tool Conference
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The Proceedings of The Manufacturing & Machine Tool Conference 2019.13 (0), D26-, 2019
The Japan Society of Mechanical Engineers
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Details 詳細情報について
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- CRID
- 1390848250107069440
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- NII Article ID
- 130007836431
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- ISSN
- 24243094
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- Text Lang
- ja
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- Data Source
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- JaLC
- Crossref
- CiNii Articles
- OpenAIRE
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- Abstract License Flag
- Disallowed