Thermal Conductivity of a Halide Perovskite Thin Film

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  • ハロゲン化ペロブスカイト薄膜の熱伝導率

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<p>In order to improve thermoelectric performance of printed halide perovskite, CsSnI3 thin films were fabricated under different conditions. The cross-plane thermal conductivities of thin films were measured by 3ω method. The surface morphology was observed using Scanning Electron Microscopy. Thin films annealed at 100oC and 130oC had uneven and smaller crystal grains than the one at 70oC. Thin films which have finer crystal grains on the surface tend to have lower thermal conductivity. Influence of phonon grain boundary scattering is considered as one of the factors for lower thermal conductivity. For further development, we will observe cross-sectional crystal grains since the thermal conductivity was measured along the film thickness direction.</p>

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