書誌事項
- タイトル別名
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- Degradation Analysis of Photovoltaic Modules with Outdoor I-V Curve Data by means of Linear Interpolation Method and Translation Formula with Series Resistance
- センケイ ホカンホウ ト チョクレツ テイコウ オ モチイタ ヘンカンシキ ニ ヨル オクガイ I-Vカーブデータ オ モチイタ タイヨウ デンチ モジュール ノ レッカ カイセキ
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説明
<p>Degradation analysis methods of PV modules using many outdoor Current-Voltage (I-V) curve data are proposed in this paper. The I-V curve data measured under various outdoor conditions are translated to the Standard Test Conditions (STC) by two kinds of translation procedures. Procedure.1 directly translates to the STC by linear interpolation method (LIM) with many reference I-V curves, which are created by I-V curve fittings. Procedure.2 is a combination of procedure1 and translation formula. Characteristic values such as maximum power, short circuit current, open circuit voltage, fill factor, series resistance and shunt resistance are quantitatively evaluated with both methods. Degradation rates of mono crystalline Si and polycrystalline Si modules were analyzed and accuracies were verified by comparing with indoor measurement results. Although open circuit voltage between the two proposed methods were different, the almost same annual degradation rates were obtained.</p>
収録刊行物
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- 太陽エネルギー
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太陽エネルギー 46 (3), 85-93, 2020-05-31
一般社団法人 日本太陽エネルギー学会
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詳細情報 詳細情報について
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- CRID
- 1390848250116017664
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- NII論文ID
- 130007852561
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- NII書誌ID
- AN00352129
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- ISSN
- 24335592
- 03889564
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- NDL書誌ID
- 030479126
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- NDLサーチ
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可