Required Diffusion Time for in-situ Measurement of Diffusion Coefficients in Liquid Alloys by X-ray Fluorescence Analysis
-
- KOBAYASHI Yoshihiro
- Department of Applied Mechanics and Aerospace Engineering, Waseda University
-
- SHIINOKI Masato
- Department of Materials Science, Waseda University Kagami Memorial Institute of Materials Science and Technology, Waseda University
-
- YAMATAKE Reina
- Department of Applied Mechanics and Aerospace Engineering, Waseda University
-
- MASAKI Tadahiko
- Department of Materials Science and Engineering, Shibaura Institute of Technology
-
- SUZUKI Shinsuke
- Department of Applied Mechanics and Aerospace Engineering, Waseda University Department of Materials Science, Waseda University Kagami Memorial Institute of Materials Science and Technology, Waseda University
説明
This study establishs a method to determine the diffusion time required for diffusion measurement by using the long capillary technique and through in-situ X-ray fluorescence analysis. A diffusion couple of pure Sn (60 mm height) and Sn90Bi10 (3 mm height) was set to provide stable density layering and maintained at 573 K. The X-ray source was positioned 10 mm above the bottom of the sample. The detected intensity of Lβ emission line of Bi (Bi Lβ) changed mainly because of the diffusion of Bi in liquid Sn. The apparent diffusion coefficients (𝐷𝑎𝑝𝑝) were calculated by fitting the analytical solution for the diffusion to the temporal distribution of Bi Lβ intensity by varying the fitting time range from 0 to 𝑡𝐷 (diffusion time). The change in 𝐷𝑎𝑝𝑝 was large at short 𝑡𝐷, but decreased with increasing 𝑡𝐷. The deviation of 𝐷𝑎𝑝𝑝 from the value corresponding to the longest 𝑡𝐷 and the maximum range scale of the confidence interval of 𝐷𝑎𝑝𝑝 were determined. The largest calculated value is considered to be the systematic error in the diffusion measurement (𝛥𝐷). For the required value of 𝑡𝐷, 𝛥𝐷 becomes less than the acceptable systematic error in the diffusion measurement. The convergent 𝐷𝑎𝑝𝑝 [(2.16±0.09)×10-9 m2/s] agreed with the microgravity reference data in the error range.
収録刊行物
-
- International Journal of Microgravity Science and Application
-
International Journal of Microgravity Science and Application 38 (3), 380302-, 2021-07-31
日本マイクログラビティ応用学会
- Tweet
キーワード
詳細情報 詳細情報について
-
- CRID
- 1390851862123699328
-
- NII論文ID
- 130008070031
-
- ISSN
- 21889783
-
- 本文言語コード
- en
-
- 資料種別
- journal article
-
- データソース種別
-
- JaLC
- CiNii Articles
- KAKEN
-
- 抄録ライセンスフラグ
- 使用可
