3D time-resolved electrostatic force microscopy

Bibliographic Information

Other Title
  • 時間分解静電気力プローブ顕微鏡の3次元展開

Description

<p>Nanoscale observation of charge migration is crucial for understanding and controlling functional materials and devices. We developed tip-synchronized time-resolved electrostatic force microscopy. The analysis of cantilever motion provides the temporal resolution with the timescale of cantilever vibration cycle. The observation of sub-microsecond charge migration is achieved for photovoltaic bilayer and conductive polymer thin films by a movie with 0.3 microsecond frame step time resolution.</p>

Journal

Details 詳細情報について

  • CRID
    1390853443032000512
  • NII Article ID
    130008133994
  • DOI
    10.14886/jvss.2021.0_2ba02
  • ISSN
    24348589
  • Text Lang
    ja
  • Data Source
    • JaLC
    • CiNii Articles
  • Abstract License Flag
    Disallowed

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