Electronic states of EuCu<sub>2</sub>Ge<sub>2</sub> and EuCu<sub>2</sub>Si<sub>2</sub> studied by soft x-ray angle-resolved photoemission spectroscopy
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- Kawasaki I.
- MSRC, JAEA
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- Fujimori S. -i.
- MSRC, JAEA
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- Takeda Y.
- MSRC, JAEA
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- Yamagami H.
- MSRC, JAEA Fac. of Sci., Kyoto Sangyo Univ.
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- Iha W.
- Grad. Sch. of Eng. and Sci., Univ. of the Ryukyus
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- Hedo M.
- Fac. of Sci., Univ. of the Ryukyus
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- Nakama T.
- Fac. of Sci., Univ. of the Ryukyus
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- Onuki Y.
- Fac. of Sci., Univ. of the Ryukyus
Bibliographic Information
- Other Title
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- 軟X線角度分解光電子分光法によるEuCu<sub>2</sub>Ge<sub>2</sub>とEuCu<sub>2</sub>Si<sub>2</sub>の電子状態の研究
Journal
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- Meeting Abstracts of the Physical Society of Japan
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Meeting Abstracts of the Physical Society of Japan 74.1 (0), 2278-2278, 2019
The Physical Society of Japan
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Keywords
Details 詳細情報について
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- CRID
- 1390853879739310336
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- NII Article ID
- 130008147274
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- ISSN
- 21890803
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- Text Lang
- ja
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- Data Source
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- JaLC
- CiNii Articles