Electronic structure of YbCu<sub>2</sub>Si<sub>2</sub> investigated by resonant hard x-ray photoemission spectroscopy

DOI

Bibliographic Information

Other Title
  • 共鳴硬X線光電子分光によるYbCu<sub>2</sub>Si<sub>2</sub>の電子状態の研究

Journal

Details 詳細情報について

  • CRID
    1390853879745253376
  • NII Article ID
    130008147209
  • DOI
    10.11316/jpsgaiyo.74.1.0_2222
  • ISSN
    21890803
  • Text Lang
    ja
  • Data Source
    • JaLC
    • CiNii Articles

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