Raman spectroscopy of highly Si-doped GaN film at cross-section
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- Ma Bei
- Chiba Univ.
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- Tang Mingchuan
- Chiba Univ.
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- Morita Ken
- Chiba Univ.
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- Ueno Kohei
- The Univ. of Tokyo
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- Kobayashi Atsushi
- The Univ. of Tokyo
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- Fujioka Hiroshi
- The Univ. of Tokyo
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- Ishitani Yoshihiro
- Chiba Univ.
Bibliographic Information
- Other Title
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- 高SiドープGaN薄膜の断面ラマン分光測定
Journal
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- JSAP Annual Meetings Extended Abstracts
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JSAP Annual Meetings Extended Abstracts 2021.1 (0), 2606-2606, 2021-02-26
The Japan Society of Applied Physics
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Keywords
Details 詳細情報について
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- CRID
- 1390855422510987520
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- ISSN
- 24367613
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- Text Lang
- ja
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- Data Source
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- JaLC