Yield Point Phenomenon Induced by Twinning Accompanied by Abnormal Grain Growth in Fine-Grained Copper
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- Jeong Byeong-Seok
- Department of Materials Science and Engineering & Research Institute of Advanced Materials, Seoul National University
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- Lee Keunho
- Agency for Defense Development
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- Park Siwook
- Semiconductor R&D Center, Samsung Electronics
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- Cho Woojin
- Department of Materials Science and Engineering & Research Institute of Advanced Materials, Seoul National University
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- Park Leeju
- Agency for Defense Development
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- Han Heung Nam
- Department of Materials Science and Engineering & Research Institute of Advanced Materials, Seoul National University
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<p>In this study, an equiaxed fine-grained copper specimen was fabricated by powder injection molding, followed by hot isostatic pressing. The specimen showed a yield point phenomenon with a Lüders-type deformation during a uniaxial tensile test. This study aimed to identify the cause of the yield point phenomenon in the fine-grained copper specimen. First, the Lüders band was designed to partially propagate within the gauge section through an interrupted uniaxial tensile test equipped with a digital image correlation system. The microstructures of the Lüders and non-Lüders band regions were compared by electron backscatter diffraction. It was observed that self-annealing was accelerated by the applied stress in the Lüders band region. Consequently, the microstructure of the Lüders band region transformed into a bimodal structure composed of fine grains and abnormally coarse grains containing numerous large twins. Identification of active twin variants in the abnormally coarse grains suggested that a significant tensile strain can be accommodated by this twinning. Based on these results, it was confirmed that the strain burst generated by the sudden occurrence of numerous large twins induces the yield point phenomenon in the fine-grained copper.</p>
収録刊行物
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- MATERIALS TRANSACTIONS
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MATERIALS TRANSACTIONS 63 (10), 1296-1303, 2022-10-01
公益社団法人 日本金属学会
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詳細情報 詳細情報について
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- CRID
- 1390856506095595264
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- NII書誌ID
- AA1151294X
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- ISSN
- 13475320
- 13459678
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- NDL書誌ID
- 032418067
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
- Crossref
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- 抄録ライセンスフラグ
- 使用不可