Development of a Suppression Technique of Potential-Induced Degradation by a Formation of Glass Layer in Si PV Modules

DOI Web Site Web Site 18 References
  • Huai Go Sian
    Environmental and Renewable Energy Systems Division, Graduate School of Engineering, Gifu University
  • Haga Takahiko
    Department of Electrical, Electronic and Computer Engineering, Faculty of Engineering, Gifu University
  • Ohashi Fumitaka
    Department of Electrical, Electronic and Computer Engineering, Faculty of Engineering, Gifu University
  • Yoshida Hiroki
    Department of Electrical, Electronic and Computer Engineering, Faculty of Engineering, Gifu University
  • Kume Tetsuji
    Department of Electrical, Electronic and Computer Engineering, Faculty of Engineering, Gifu University International Joint Department of Integrated Mechanical Engineering of IITG and GU, the Graduate School of Engineering, Gifu University
  • Nonomura Shuichi
    Gifu Study Center, The Open University of Japan

Search this article

Abstract

<p>Shunt-type potential-induced degradation (PID) is one of the degradation phenomena of photovoltaic (PV) modules which degrade PV performance drastically in short time compared to other degradation modes. In this paper, a new suppression technique of the PID was developed by coating a glass layer (GL) on the top or bottom surface of cover glass using a chemical solution known as liquid glass. PID tests were conducted using PV modules prepared with and without GL. A clear suppression effects of the PID were observed by forming GL, and the occurrence of the PID was delayed about 4 times by the formation of GL on the bottom side of cover glass in PV modules.</p>

Journal

  • MATERIALS TRANSACTIONS

    MATERIALS TRANSACTIONS 64 (1), 165-170, 2023-01-01

    The Japan Institute of Metals and Materials

References(18)*help

See more

Keywords

Details 詳細情報について

Report a problem

Back to top