A METHOD FOR IMPROVING THE ACCURACY OF SFM 3D MEASUREMENTS BY RANDOM PATTERN PROJECTION

DOI Web Site 1 Citations 4 References Open Access
  • SUGANO Miki
    Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology
  • KAKIZAKI Ken’ichi
    Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology
  • TOMINAGA Yasumasa
    Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology
  • ARAKI Shunsuke
    Graduate School of Computer Science and Systems Engineering, Kyushu Institute of Technology

Bibliographic Information

Other Title
  • ランダムパターン投影によるSfM三次元計測の精度向上手法

Description

<p>SfM can reconstruct the 3D shape of an object with high accuracy if there are many feature points on the surface to be measured. However, in the field of architecture, there is a problem that building surfaces are beautifully preserved and the shape cannot be reconstructed because of the small number of feature points. In this study, we proposed a method to improve the measurement accuracy of SfM by projecting a random pattern on a wall surface and distributing a large number of feature points. Experiments confirmed that the measurement accuracy was as good as that of a laser scanner.</p>

Journal

Citations (1)*help

See more

References(4)*help

See more

Keywords

Details 詳細情報について

Report a problem

Back to top