Development of Fluorescence XAFS Imaging Using Pinhole Camera

DOI

Bibliographic Information

Other Title
  • ピンホールカメラを利用した蛍光XAFSイメージング法の開発

Abstract

<p>In the imaging XAFS method using an X-ray CCD detector, a transmission method has been applied to heavy elements with absorption edges at relatively high energies. Although the transmission method requires the sample to be an optimal thickness, the high-energy X-rays have high transmission capability, and can be applied to relatively thick samples. In this study, we attempted to develop a fluorescence method for fast screening of transition metal elements with the low energy X-ray absorption edges and their valence distribution in the samples such as glass materials, which are difficult to make thin. In order to obtain XAFS spectra with high sensitivity and positional resolution, a direct imaging detector without a scintillator and a pinhole were used. The results were demonstrated with a highly brilliant synchrotron radiation undulator X-ray with variable incident energy.</p>

Journal

Keywords

Details 詳細情報について

  • CRID
    1390858690772709248
  • DOI
    10.57415/xshinpo.52.0_69
  • ISSN
    27583651
    09117806
  • Text Lang
    ja
  • Data Source
    • JaLC
  • Abstract License Flag
    Allowed

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