Application of Secondary Ion Mass Spectrometry for Iron and Steel Material Analysis
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- Kubota Naoyoshi
- 日鉄テクノロジー株式会社
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- Hiragino Yuto
- 日鉄テクノロジー株式会社
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- Sato Riki
- 日鉄テクノロジー株式会社
Bibliographic Information
- Other Title
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- 鉄鋼材料分析への二次イオン質量分析法の適用
Abstract
Time-of-flight secondary ion mass spectrometry with a focused ion beam system is a useful surface analysis to measure elemental mappings around 100 nm on a lateral resolution and trace element detections on a range of ppm in atomic concentration. With these advantages, TOF-SIMS has been frequently used for iron and steel material analysis. We have demonstrated some applications in this paper, that is the B distribution along the grain boundaries in the steel sample with a trace amount of B, the detection of tribofilm from the test piece surface after the sliding test, and so on.
Journal
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- Journal of Surface Analysis
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Journal of Surface Analysis 29 (1), 33-38, 2022
The Surface Analysis Society of Japan
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Details 詳細情報について
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- CRID
- 1390859138435951488
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- ISSN
- 13478400
- 13411756
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- Text Lang
- ja
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- Data Source
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- JaLC
- Crossref
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- Abstract License Flag
- Allowed