Electrical Characterization of Dielectric Breakdown of h-BN
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- Hattori Yoshiaki
- Tokyo Univ.
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- Taniguchi Takashi
- NIMS
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- Watanabe Kenji
- NIMS
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- Nagashio Kosuke
- Tokyo Univ.
Bibliographic Information
- Other Title
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- h-BN層状絶縁物質における電気的絶縁破壊挙動
Journal
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- JSAP Annual Meetings Extended Abstracts
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JSAP Annual Meetings Extended Abstracts 2014.2 (0), 119-119, 2014-09-01
The Japan Society of Applied Physics
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Details 詳細情報について
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- CRID
- 1390859370677606784
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- ISSN
- 24367613
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- Text Lang
- ja
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- Data Source
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- JaLC