Measuring the conduction band of Ta<sub>2</sub>NiSe<sub>5</sub> using low energy inverse photoelectron spectroscopy
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- Kawamura Keita
- Graduate School of Science and Engineering, Chiba University
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- Sato Haruki
- Graduate School of Science and Engineering, Chiba University
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- Orio Hibiki
- Graduate School of Science and Engineering, Chiba University
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- Sugimoto Koudai
- Faculty of Science and Technology, Keio University
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- Ohta Yukinori
- Graduate School of Science, Chiba University
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- Ootsuki Daiki
- Graduate School of Human and Environmental Studies, Kyoto University
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- Yoshida Teppei
- Graduate School of Human and Environmental Studies, Kyoto University
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- Maruoka Urara
- Graduate School of Science, Nagoya University
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- Nakano Akitoshi
- Graduate School of Science, Nagoya University
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- Terasaki Ichiro
- Graduate School of Science, Nagoya University
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- Yoshida Hiroyuki
- Graduate School of Engineering, Chiba University Molecular Chirality Research Center, Chiba University
Bibliographic Information
- Other Title
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- 低エネルギー逆光電子分光によるTa<sub>2</sub>NiSe<sub>5</sub>の伝導帯の直接観測
Abstract
<p>Ta2NiSe5 is a candidate for the excitonic insulator. Recent photoemission study revealed that the valence band minimum shifts to the low energy side at low temperature, which is consistent with the excitonic insulator. To confirm this, it is necessary to observe the conduction band. In this study, we examined the conduction band of Ta2NiSe5 using the low energy inverse photoelectron spectroscopy (LEIPS). The lowest unoccupied band was observed at 0.55 eV above the Fermi level. This band did not shift at the low temperature of 80 K. This result supports the recent proposed picture that the Ta2NiSe5 is different from the conventional excitonic insulator; the noninteracting band structure is a band-overlap semimetal and the bandgap opens by the strong electron-hole attraction.</p>
Journal
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- Abstract book of Annual Meeting of the Japan Society of Vacuum and Surface Science
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Abstract book of Annual Meeting of the Japan Society of Vacuum and Surface Science 2020 (0), 135-, 2020
The Japan Society of Vacuum and Surface Science
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Details 詳細情報について
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- CRID
- 1391412881268818432
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- NII Article ID
- 130007959320
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- ISSN
- 24348589
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- Text Lang
- ja
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- Data Source
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- JaLC
- CiNii Articles
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- Abstract License Flag
- Disallowed