Basic Study on Safe Separation Distance of Electronic Circuits Near AC Transmission Lines
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- Miyajima Kiyotomi
- Central Research Institute of Electric Power Industry
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- Arima Takuji
- Tokyo University of Agriculture and Technology
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- Uno Toru
- Tokyo University of Agriculture and Technology
Bibliographic Information
- Other Title
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- 交流送電線近傍の電子回路の安全離隔距離に関する基礎検討
- コウリュウソウ デンセン キンボウ ノ デンシ カイロ ノ アンゼン リカク キョリ ニ カンスル キソ ケントウ
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Abstract
<p>Electronic devices used in the vicinity of AC overhead transmission lines are often suffered from malfunctions due to high electric field. However, the mechanism of the malfunction has not been clarified. In this paper, a simple electric circuit which is composed of two parts was fabricated and exposed to high electric field to clarify the malfunction occurrence condition. Based on the experiments, the safe separation distance between the electronic circuit and the transmission line was derived as a function of the electric field around the overhead transmission line.</p>
Journal
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- IEEJ Transactions on Fundamentals and Materials
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IEEJ Transactions on Fundamentals and Materials 140 (11), 516-521, 2020-11-01
The Institute of Electrical Engineers of Japan
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Details 詳細情報について
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- CRID
- 1391975276374987904
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- NII Article ID
- 130007934060
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- NII Book ID
- AN10136312
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- ISSN
- 13475533
- 03854205
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- NDL BIB ID
- 030731709
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
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- Abstract License Flag
- Disallowed