OOIWA Akira

About this person

Affiliation
  • National Metrology Institute of Japan(NMIJ), National Institute of Advanced Industrial Science and Technology(AIST) (At 2009-04-10)

Related Articles

Related Data

Related Books

Related Dissertations

Related Projects

Related Products

Details 詳細情報について

  • CRID
    1410292240175791872
  • NII Researcher ID
    9000014260055
  • Data Source
    • JaLC
    • CiNii Articles
    • NDL

Search this author

Report a problem

Back to top